Pogo Pin PAL75-F1

The PAL75-F1 is a spring-loaded test probe with a pointed four-claw tip, designed for reliable temporary electrical contact during PCB and electronic circuit testing. Its four-claw contact head is suitable for contacting test points, terminals, solder areas, and other PCB features in ICT/FCT fixtures. The probe uses gold-plated conductive components for stable electrical contact.

Specifications

Applications

• ICT (In-Circuit Testing)
• FCT (Functional Circuit Testing)
• PCB electrical testing
• PCB test fixtures and jigs
• Continuity testing
• Electronic circuit testing
• Production-line testing
• Automated Test Equipment (ATE)